Sánchez Clemente, Antonio José ; Barrios Alfaro,Yubal ; Santos Falcón, Lucana ; Sarmiento Rodríguez, Roberto 
Issued date: 2024
Source: Microprocessors and Microsystems [ ISSN 0141-9331], v. 104, 104987, (Febrero 2024)
SJR: 0,488
- Q2
JCR: 2,6
- Q2
SCIE
MIAR ICDS: 11,0
Artículo
Barrios Alfaro,Yubal ; Bartrina-Rapestà, Joan; Hernández-Cabronero, Miguel; Sánchez Clemente, Antonio José ; Blanes, Ian, et al
Issued date: 2024
SJR: 1,284
- Q1
JCR: 4,8
- Q1
SCIE
MIAR ICDS: 10,7
Artículo
Sanchez Clemente, A. J. ; Blanes, Ian; Barrios Alfaro, Yubal ; Hernandez-Cabronero, Miguel; Bartrina-Rapesta, Joan, et al
Issued date: 2022
Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X], (Enero 2022)
SJR: 1,284
- Q1
JCR: 4,8
- Q1
SCIE
MIAR ICDS: 10,7
Artículo
Sánchez Clemente, Antonio José ; Barrios Alfaro,Yubal ; Ventura Henríquez,Diego ; Sarmiento Rodríguez, Roberto 
Issued date: 2022
Source: 25th Euromicro Conference on Digital System Design (DSD), Maspalomas, Spain, 2022
Actas de congresos
Sánchez, Antonio ; Barrios Alfaro,Yubal ; Sarmiento Rodríguez, Roberto ; Hernández Expósito, David; Sánchez Gómez, Antonio
Issued date: 2022
Source: 37th Conference on Design of Circuits and Integrated Circuits (DCIS), Pamplona, Spain, 2022, p. 01-06, (2022)
Actas de congresos
Barrios Alfaro, Yubal ; Sánchez, Antonio ; Guerra, Raúl ; Sarmiento, Roberto 
Issued date: 2021
Source: Remote Sensing [EISSN 2072-4292], v. 13 (21), 4388, (Noviembre 2021)
SJR: 1,283
- Q1
JCR: 5,349
- Q1
SCIE
MIAR ICDS: 10,6
Artículo
Ventura Henríquez, Diego ; Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Sarmiento, Roberto 
Issued date: 2021
Source: 36th Conference on Design of Circuits and Integrated Systems, DCIS 2021[EISSN 2640-5563], (Enero 2021)
Actas de congresos
Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Santos, Lucana ; Sarmiento, Roberto 
Issued date: 2020
Source: IEEE Access [ISSN 2169-3536],v. 8, p. 54269-54287
SJR: 0,587
- Q1
JCR: 3,367
- Q2
SCIE
Artículo
ShyLOC2.pdf.jpg
Aranda, Luis Alberto; Sánchez Clemente, Antonio José ; Garcia-Herrero, Francisco; Barrios Alfaro, Yubal ; Sarmiento, Roberto , et al
Issued date: 2020
Source: Electronics (Switzerland) [EISSN 2079-9292], v. 9 (10), 1681, (Octubre 2020)
SJR: 0,36
- Q2
JCR: 2,397
- Q3
SCIE
Artículo
electronics-09-01681-v2.pdf.jpg
Barrios Alfaro, Yubal ; Rodríguez, Alfonso; Sánchez Clemente, Antonio José ; Pérez, Arturo; López, Sebastián , et al
Issued date: 2020
Source: Electronics (Switzerland)[EISSN 2079-9292],v. 9 (10), p. 1-23, (Octubre 2020)
SJR: 0,36
- Q2
JCR: 2,397
- Q3
SCIE
Artículo
electronics-09-01576.pdf.jpg
Armesto Caride, L.; Rodríguez, A; Pérez Garcia, A.; Sáez, S.; Valls, J., et al
Issued date: 2019
Source: Validation and Verification of Automated Systems: Results of the ENABLE-S3 Project / Leitner A., Watzenig D., Ibanez-Guzman J. (eds), p. 231-249, (Enero 2019)
itemlist.container.dc.description.spiq Q1
Capítulo de libro
Sánchez Clemente, Antonio José ; Barrios Alfaro, Yubal ; Santos, Lucana ; Sarmiento, Roberto 
Issued date: 2019
Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019
Actas de congresos
Sánchez Clemente, Antonio José ; Entrena, Luis; Kastensmidt, Fernanda
Issued date: 2018
Source: 2018 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2018, p. 112-119
Actas de congresos
Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Santos, Lucana ; Lopez, Sebastian ; Lopez, Jose Fco , et al
Issued date: 2018
Source: Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276],v. 2018-September
Actas de congresos
Albandes, I.; Serrano-Cases, A.; Sánchez Clemente, Antonio José ; Martins, M.; Martinez-Alvarez, A., et al
Issued date: 2018
Source: Latin American Test Workshop, LATW, p. 1-6
Actas de congresos
Sánchez Clemente, Antonio José ; Entrena, Luis; Hrbacek, Radek; Sekanina, Lukas
Issued date: 2016
Source: IEEE Transactions on Reliability [ISSN 0018-9529], v. 65(4), p. 1871-1883, (Diciembre 2016)
SJR: 1,335
- Q1
JCR: 2,79
- Q1
SCIE
Artículo
Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M.
Issued date: 2016
Artículo
Quinn, H; Robinson, WH; Rech, P; Aguirre, M; Barnard, A, et al
Issued date: 2015
SJR: 0,924
- Q1
JCR: 3,711
- Q1
Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M.
Issued date: 2014
Artículo
Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M.; Lopez-Ongil, C.
Issued date: 2012
Source: Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
Artículo