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Sánchez Clemente, Antonio José ; Barrios Alfaro,Yubal ; Santos Falcón, Lucana ; Sarmiento Rodríguez, Roberto Issued date: 2024 Source: Microprocessors and Microsystems [ ISSN 0141-9331], v. 104, 104987, (Febrero 2024) SJR: 0,488 - Q2 JCR: 2,6 - Q2 SCIE MIAR ICDS: 11,0 Artículo
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Barrios Alfaro,Yubal ; Bartrina-Rapestà, Joan; Hernández-Cabronero, Miguel; Sánchez Clemente, Antonio José ; Blanes, Ian, et al Issued date: 2024 SJR: 1,284 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo
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Sanchez Clemente, A. J. ; Blanes, Ian; Barrios Alfaro, Yubal ; Hernandez-Cabronero, Miguel; Bartrina-Rapesta, Joan, et al Issued date: 2022 Source: IEEE Geoscience and Remote Sensing Letters[ISSN 1545-598X], (Enero 2022) SJR: 1,284 - Q1 JCR: 4,8 - Q1 SCIE MIAR ICDS: 10,7 Artículo
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Sánchez Clemente, Antonio José ; Barrios Alfaro,Yubal ; Ventura Henríquez,Diego ; Sarmiento Rodríguez, Roberto Issued date: 2022 Source: 25th Euromicro Conference on Digital System Design (DSD), Maspalomas, Spain, 2022 Actas de congresos
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Sánchez, Antonio ; Barrios Alfaro,Yubal ; Sarmiento Rodríguez, Roberto ; Hernández Expósito, David; Sánchez Gómez, Antonio Issued date: 2022 Source: 37th Conference on Design of Circuits and Integrated Circuits (DCIS), Pamplona, Spain, 2022, p. 01-06, (2022) Actas de congresos
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Barrios Alfaro, Yubal ; Sánchez, Antonio ; Guerra, Raúl ; Sarmiento, Roberto Issued date: 2021 Source: Remote Sensing [EISSN 2072-4292], v. 13 (21), 4388, (Noviembre 2021) SJR: 1,283 - Q1 JCR: 5,349 - Q1 SCIE MIAR ICDS: 10,6 Artículo
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Ventura Henríquez, Diego ; Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Sarmiento, Roberto Issued date: 2021 Source: 36th Conference on Design of Circuits and Integrated Systems, DCIS 2021[EISSN 2640-5563], (Enero 2021) Actas de congresos
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Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Santos, Lucana ; Sarmiento, Roberto Issued date: 2020 Source: IEEE Access [ISSN 2169-3536],v. 8, p. 54269-54287 SJR: 0,587 - Q1 JCR: 3,367 - Q2 SCIE Artículo
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Aranda, Luis Alberto; Sánchez Clemente, Antonio José ; Garcia-Herrero, Francisco; Barrios Alfaro, Yubal ; Sarmiento, Roberto , et al Issued date: 2020 Source: Electronics (Switzerland) [EISSN 2079-9292], v. 9 (10), 1681, (Octubre 2020) SJR: 0,36 - Q2 JCR: 2,397 - Q3 SCIE Artículo
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Barrios Alfaro, Yubal ; Rodríguez, Alfonso; Sánchez Clemente, Antonio José ; Pérez, Arturo; López, Sebastián , et al Issued date: 2020 Source: Electronics (Switzerland)[EISSN 2079-9292],v. 9 (10), p. 1-23, (Octubre 2020) SJR: 0,36 - Q2 JCR: 2,397 - Q3 SCIE Artículo
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Armesto Caride, L.; Rodríguez, A; Pérez Garcia, A.; Sáez, S.; Valls, J., et al Issued date: 2019 Source: Validation and Verification of Automated Systems: Results of the ENABLE-S3 Project / Leitner A., Watzenig D., Ibanez-Guzman J. (eds), p. 231-249, (Enero 2019) itemlist.container.dc.description.spiq Q1 Capítulo de libro
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Sánchez Clemente, Antonio José ; Barrios Alfaro, Yubal ; Santos, Lucana ; Sarmiento, Roberto Issued date: 2019 Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 Actas de congresos
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Sánchez Clemente, Antonio José ; Entrena, Luis; Kastensmidt, Fernanda Issued date: 2018 Source: 2018 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2018, p. 112-119 Actas de congresos
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Barrios Alfaro, Yubal ; Sánchez Clemente, Antonio José ; Santos, Lucana ; Lopez, Sebastian ; Lopez, Jose Fco , et al Issued date: 2018 Source: Workshop on Hyperspectral Image and Signal Processing, Evolution in Remote Sensing [ISSN 2158-6276],v. 2018-September Actas de congresos
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Albandes, I.; Serrano-Cases, A.; Sánchez Clemente, Antonio José ; Martins, M.; Martinez-Alvarez, A., et al Issued date: 2018 Source: Latin American Test Workshop, LATW, p. 1-6 Actas de congresos
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Sánchez Clemente, Antonio José ; Entrena, Luis; Hrbacek, Radek; Sekanina, Lukas Issued date: 2016 Source: IEEE Transactions on Reliability [ISSN 0018-9529], v. 65(4), p. 1871-1883, (Diciembre 2016) SJR: 1,335 - Q1 JCR: 2,79 - Q1 SCIE Artículo
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Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M. Issued date: 2016 Artículo
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Quinn, H; Robinson, WH; Rech, P; Aguirre, M; Barnard, A, et al Issued date: 2015 SJR: 0,924 - Q1 JCR: 3,711 - Q1
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Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M. Issued date: 2014 Artículo
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Sánchez Clemente, Antonio José ; Entrena, L.; Garcia-Valderas, M.; Lopez-Ongil, C. Issued date: 2012 Source: Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012 Artículo
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